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optoelectronic semiconductor component

OSRAM Opto Semiconductors GmbH

An optoelectronic semiconductor component is disclosed. In an embodiment, the semiconductor component includes at least one optoelectronic

8/19/2019

optoelectronic semiconductor component

OSRAM Opto Semiconductors GmbH

An optoelectronic semiconductor component is disclosed. In an embodiment, the semiconductor component includes at least one optoelectronic

8/19/2019

optoelectronic semiconductor component

OSRAM Opto Semiconductors GmbH

An optoelectronic semiconductor component is disclosed. In an embodiment, the semiconductor component includes at least one optoelectronic

8/19/2019

optoelectronic semiconductor component

OSRAM Opto Semiconductors GmbH

An optoelectronic semiconductor component is disclosed. In an embodiment, the semiconductor component includes at least one optoelectronic

8/19/2019

optoelectronic semiconductor component

OSRAM Opto Semiconductors GmbH

An optoelectronic semiconductor component is disclosed. In an embodiment, the semiconductor component includes at least one optoelectronic

8/19/2019

integrated measuring system for the spectral measuring technique

Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.

A measuring system comprises a substrate (IO), which has a quantum dot layer, which is arranged on the substrate and which comprises an emission

8/19/2019

integrated measuring system for the spectral measuring technique

Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.

A measuring system comprises a substrate (IO), which has a quantum dot layer, which is arranged on the substrate and which comprises an emission

8/19/2019

integrated measuring system for the spectral measuring technique

Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.

A measuring system comprises a substrate (IO), which has a quantum dot layer, which is arranged on the substrate and which comprises an emission

8/19/2019

integrated measuring system for the spectral measuring technique

Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.

A measuring system comprises a substrate (IO), which has a quantum dot layer, which is arranged on the substrate and which comprises an emission

8/19/2019

integrated measuring system for the spectral measuring technique

Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.

A measuring system comprises a substrate (IO), which has a quantum dot layer, which is arranged on the substrate and which comprises an emission

8/19/2019

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